Simicic, MarkoMarkoSimicicWu, Wei-MinWei-MinWuClaes, DieterDieterClaesTamura, ShinichiShinichiTamuraShimada, YoheiYoheiShimadaSawada, MasanoriMasanoriSawadaChen, Shih-HungShih-HungChen2022-06-282022-05-052022-05-162022-06-282021978-1-58537-330-70739-5159WOS:000786179000028https://imec-publications.be/handle/20.500.12860/39751Wafer-Level LICCDM Device TestingProceedings paper10.23919/EOS/ESD52038.2021.9574789978-1-58537-329-1WOS:000786179000028Electrical & electronic engineering