Degryse, DominiekDominiekDegryseLabie, RietRietLabieVandevelde, BartBartVandeveldeBeyne, EricEricBeyne2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7481Finite element modeling of shear test on bumped Cu-low K wafersOral presentation