A simulation study on process sensitivity of a line tunnel field-effect transistor

Walke, AmeyAmeyWalkeVandenberghe, WilliamWilliamVandenbergheKao, FrankFrankKaoVandooren, AnneAnneVandoorenGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/23367A simulation study on process sensitivity of a line tunnel field-effect transistorJournal article