Accessing electronic properties of two-dimensional materials with gate-dependent micro four-point probe

Introna, MarcoMarcoIntronaBogdanowicz, JanuszJanuszBogdanowiczSilva, Henry MedinaHenry MedinaSilvaBanerjee, SreetamaSreetamaBanerjeeKalhauge, Kristoffer G.Kristoffer G.KalhaugeWouters, LennaertLennaertWoutersShi, YuanyuanYuanyuanShiKim, Ju-SeokJu-SeokKimLin, DennisDennisLinAsselberghs, IngeIngeAsselberghsAdelmann, ChristophChristophAdelmannAfanas'Ev, Valeri V.Valeri V.Afanas'EvZandvliet, Harold J. W.Harold J. W.ZandvlietCelano, UmbertoUmbertoCelano2024-12-172024-12-172025-JAN 12053-1583WOS:001374019800001https://imec-publications.be/handle/20.500.12860/44988Accessing electronic properties of two-dimensional materials with gate-dependent micro four-point probeJournal article10.1088/2053-1583/ad9843WOS:001374019800001GRAPHENE