Roebben, G.G.RoebbenZhao, ChaoChaoZhaoDuan, R. G.R. G.DuanVleugels, J.J.VleugelsHeyns, MarcMarcHeynsVan Der Biest, O.O.Van Der Biest2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6761In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirrorProceedings paper