Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells

Devulder, WouterWouterDevulderOpsomer, KarlKarlOpsomerFranquet, AlexisAlexisFranquetMeersschaut, JohanJohanMeersschautBelmonte, AttilioAttilioBelmonteMuller, RobertRobertMullerDe Schutter, BobBobDe SchutterVan Elshocht, SvenSvenVan ElshochtJurczak, GosiaGosiaJurczakGoux, LudovicLudovicGouxDetavernier, ChristopheChristopheDetavernier2021-10-222021-10-2220140021-8979https://imec-publications.be/handle/20.500.12860/23758Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cellsJournal articlehttp://scitation.aip.org/content/aip/journal/jap/115/5/10.1063/1.4863722