Waldhoer, DominicDominicWaldhoerSchleich, ChristianChristianSchleichMichl, JakobJakobMichlGrill, AlexanderAlexanderGrillClaes, DieterDieterClaesKarl, AlexanderAlexanderKarlKnobloch, TheresiaTheresiaKnoblochRzepa, GerhardGerhardRzepaFranco, JacopoJacopoFrancoKaczer, BenBenKaczerWaltl, MichaelMichaelWaltlGrasser, TiborTiborGrasser2023-08-022023-06-232023-08-0220230026-2714WOS:001001940400001https://imec-publications.be/handle/20.500.12860/42076Comphy v3.0-A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devicesJournal article10.1016/j.microrel.2023.115004WOS:001001940400001BIAS TEMPERATURE INSTABILITYVOLTAGE INSTABILITYINTERFACEDEFECTSNBTIDEPENDENCEEMISSIONNOISEDEGRADATIONCAPTURE