On the hot-hole induced post-stress interface trap generation in MOSFETs

Al-Kofahi, I. S.I. S.Al-KofahiZhang, JennyJennyZhangGroeseneken, GuidoGuidoGroeseneken2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1052On the hot-hole induced post-stress interface trap generation in MOSFETsProceedings paper