Dos Santos, SaraSaraDos SantosCretu, BogdanBogdanCretuStrobel, VincentVincentStrobelRoutoure, Jean-MarcJean-MarcRoutoureCarin, RegisRegisCarinMartino, Joao AntonioJoao AntonioMartinoAoulaiche, MarcMarcAoulaicheSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-222021-10-2220140038-1101https://imec-publications.be/handle/20.500.12860/23770Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectricsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0038110114000823