Santos, S.D.S.D.SantosMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/16158DIBL study using trible gate unstrained and uniaxial/biaxial strained FinFETsProceedings paper