Lee, Jae WooJae WooLeeSimoen, EddyEddySimoenVeloso, AnabelaAnabelaVelosoCho, Moon JuMoon JuChoArimura, HiroakiHiroakiArimuraBoccardi, GuillaumeGuillaumeBoccardiRagnarsson, Lars-AkeLars-AkeRagnarssonChiarella, ThomasThomasChiarellaHoriguchi, NaotoNaotoHoriguchiThean, AaronAaronTheanGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130018-9383https://imec-publications.be/handle/20.500.12860/22660Low frequency noise analysis for post-treatment of replacement metal gate FinFETJournal article