Lorentzian noise in ultra-thin gate oxide SOI MOSFETs observed under conditions of a linear kink effects

Lukyanchikova, N.N.LukyanchikovaGarbar, N.N.GarbarPetrichuk, M.M.PetrichukMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7834Lorentzian noise in ultra-thin gate oxide SOI MOSFETs observed under conditions of a linear kink effectsProceedings paper