Hanselaer, P.P.HanselaerVan den Abeele, A.A.Van den AbeeleForment, S.S.FormentFrisson, LouisLouisFrissonPoortmans, JefJefPoortmans2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2618Optical characterisation of silicon wafers with and without a back surface reflectorProceedings paper