Sonde, SushantSushantSondeSimoen, EddyEddySimoenClaeys, CorCorClaeysSatta, AlessandraAlessandraSattaDe Jaeger, BriceBriceDe JaegerNicholas, GarethGarethNicholasMeuris, MarcMarcMeuris2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12930Origin and suppression of junction leakage in germanium-on-silicon structuresProceedings paper