Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging

Duan, MengMengDuanZhang, Jian FuJian FuZhangJi, ZhigangZhigangJiZhang, Wei DongWei DongZhangVigar, DavidDavidVigarAsen, AsenovAsenovAsenGerrer, LouisLouisGerrerChandra, VikasVikasChandraAitken, RobRobAitkenKaczer, BenBenKaczer2021-10-232021-10-2320160018-9383https://imec-publications.be/handle/20.500.12860/26582Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier agingJournal articlehttp://ieeexplore.ieee.org/document/7530843/