Schreurs, DominiqueDominiqueSchreursDe Raedt, WalterWalterDe RaedtVandersmissen, RafRafVandersmissenNeuhaus, B.B.NeuhausBeyer, A.A.BeyerNauwelaers, BartBartNauwelaers2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5637Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier MMICProceedings paper