Atomic insight of Ge(1-x)Sn(x) using atom probe tomography

Kumar, ArulArulKumarGencarelli, FedericaFedericaGencarelliVincent, BenjaminBenjaminVincentKambham, Ajay KumarAjay KumarKambhamGilbert, MatthieuMatthieuGilbertVandervorst, WilfriedWilfriedVandervorst2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20961Atomic insight of Ge(1-x)Sn(x) using atom probe tomographyProceedings paper