Impact of a high electric field on the extraction of the generation lifetime from the reverse generation current component of shallow n+-p-well diodes

Poyai, AmpornAmpornPoyaiSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5586Impact of a high electric field on the extraction of the generation lifetime from the reverse generation current component of shallow n+-p-well diodesJournal article