Bias temperature instability analysis of FinFET based SRAM cells

Khan, SeyabSeyabKhanAgbo, InnocentInnocentAgboHamdioui, SaidSaidHamdiouiKukner, HalilHalilKuknerKaczer, BenBenKaczerRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoor2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24055Bias temperature instability analysis of FinFET based SRAM cellsProceedings paperhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6800245