Daami, A.A.DaamiZerrai, A.A.ZerraiMarchand, J. J.J. J.MarchandPoortmans, JefJefPoortmansBremond, G.G.Bremond2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5178Electrical defect study in thin-film SiGe/Si solar cellsJournal article