Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes

Ohyama, H.H.OhyamaTakakura, K.K.TakakuraHayama, K.K.HayamaKuboyama, S.S.KuboyamaDeguchi, Y.Y.DeguchiMatsuda, S.S.MatsudaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7942Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodesJournal article