Debucquoy, MaartenMaartenDebucquoyRockele, MaartenMaartenRockeleGenoe, JanJanGenoeGelinck, GerwinGerwinGelinckHeremans, PaulPaulHeremans2021-10-172021-10-1720091566-1199https://imec-publications.be/handle/20.500.12860/15201Charge trapping in organic transistor memories: on the role of electrons and holesJournal article