Resilience in all-optical label switching networks: a node dimensioning point of view

Van Caenegem, RuthRuthVan CaenegemColle, DidierDidierCollePickavet, MarioMarioPickavetDemeester, PietPietDemeester2021-10-162021-10-162005-11https://imec-publications.be/handle/20.500.12860/11351Resilience in all-optical label switching networks: a node dimensioning point of viewMeeting abstract