Claeys, CorCorClaeysHsu, BrentBrentHsuHe, LiangLiangHeMols, YvesYvesMolsKunert, BernardetteBernardetteKunertLanger, RobertRobertLangerWaldron, NiamhNiamhWaldronEneman, GeertGeertEnemanCollaert, NadineNadineCollaertHeyns, MarcMarcHeynsSimoen, EddyEddySimoen2021-10-252021-10-252018-06https://imec-publications.be/handle/20.500.12860/30440Are extended defects a show stopper for future III-V CMOS technologies?Proceedings paper