Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETs

Simoen, EddyEddySimoenEneman, GeertGeertEnemanClaeys, CorCorClaeysVerheyen, PeterPeterVerheyenDelhougne, RomainRomainDelhougneLoo, RogerRogerLooDe Meyer, KristinKristinDe Meyer2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11207Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETsProceedings paper