Bury, ErikErikBuryDegraeve, RobinRobinDegraeveCho, Moon JuMoon JuChoKaczer, BenBenKaczerGoes, WolfangWolfangGoesGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23594Investigation of correlated trap sites in SILC, BTI and RTN in SiON and HKMG devicesMeeting abstract