Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current drop

Marcon, DenisDenisMarconViaene, JohnJohnViaeneFavia, PaolaPaolaFaviaBender, HugoHugoBenderKang, XuanwuXuanwuKangLenci, SilviaSilviaLenciStoffels, SteveSteveStoffelsDecoutere, StefaanStefaanDecoutere2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22761Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current dropProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6599162&queryText%3DReliability+of+AlGaN%2FGaN+HEMTs%3A+permanent