Intrinsic robustness of TFET subthreshold swing to interface and oxide traps: a comparative PBTI study of InGaAs TFETs and MOSFETs

Franco, JacopoJacopoFrancoAlian, AliRezaAliRezaAlianVandooren, AnneAnneVandoorenVerhulst, AnneAnneVerhulstLinten, DimitriDimitriLintenCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-232021-10-2320160741-3106https://imec-publications.be/handle/20.500.12860/26628Intrinsic robustness of TFET subthreshold swing to interface and oxide traps: a comparative PBTI study of InGaAs TFETs and MOSFETsJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7502178