Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions

Duan, M.M.DuanZhang, J. F.J. F.ZhangJi, Z.Z.JiZhang, W. D.W. D.ZhangKaczer, BenBenKaczerSchram, TomTomSchramRitzenthaler, RomainRomainRitzenthalerGroeseneken, GuidoGuidoGroesenekenAsenov, A.A.Asenov2021-10-222021-10-2220140018-9383https://imec-publications.be/handle/20.500.12860/23774Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditionsJournal articlehttp://dx.doi.org/10.1109/TED.2014.2335053