Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memory

Celano, UmbertoUmbertoCelanoOp de Beeck, JonathanJonathanOp de BeeckClima, SergiuSergiuClimaLuebben, MichaelMichaelLuebbenKoenraad, PaulPaulKoenraadGoux, LudovicLudovicGouxValov, IliaIliaValovVandervorst, WilfriedWilfriedVandervorst2021-10-242021-10-2420171944-8244https://imec-publications.be/handle/20.500.12860/27991Direct probing of the dielectric scavenging-layer interface in oxide filamentary-based valence change memoryJournal articlehttp://pubs.acs.org/doi/abs/10.1021/acsami.6b16268