Mitard, JeromeJeromeMitardZhang, En XiaEn XiaZhangFleetwood, DanielDanielFleetwoodHachtel, JordanJordanHachtelLiang, ChundongChundongLiangReed, RobertRobertReedAlles, MichaelMichaelAllesSchrimpf, RonaldRonaldSchrimpfLinten, DimitriDimitriLintenWitters, LiesbethLiesbethWittersCollaert, NadineNadineCollaertThean, AaronAaronTheanChisholm, MatthewMatthewChisholmPantelides, SokratesSokratesPantelides2021-10-232021-10-232016-07https://imec-publications.be/handle/20.500.12860/27017Total ionizing dose effects on strained Ge pMOS FinFETs on bulk SiMeeting abstract