Duan, Guo XingGuo XingDuanHachtel, JordanJordanHachtelZhang, En XiaEn XiaZhangZhang, Cher XuanCher XuanZhangFleetwood, DanielDanielFleetwoodSchrimpf, RonaldRonaldSchrimpfReed, RobertRobertReedMitard, JeromeJeromeMitardLinten, DimitriDimitriLintenWitters, LiesbethLiesbethWittersCollaert, NadineNadineCollaertMocuta, AndaAndaMocutaChisholm, MatthewMatthewChisholmPantelides, SokratesSokratesPantelides2021-10-232021-10-2320161530-4388https://imec-publications.be/handle/20.500.12860/26581Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETsJournal articlehttp://ieeexplore.ieee.org/document/7572180/