Analysis of functional errors produced by long-term workload-dependent BTI degradation in ultralow power processors

Duch, LorisLorisDuchPeon-Quiros, MiguelMiguelPeon-QuirosWeckx, PieterPieterWeckxLevisse, AlexAlexLevisseBraojos, RubenRubenBraojosCatthoor, FranckyFranckyCatthoorAtienza, DavidDavidAtienza2021-10-282021-10-2820201063-8210https://imec-publications.be/handle/20.500.12860/35075Analysis of functional errors produced by long-term workload-dependent BTI degradation in ultralow power processorsJournal article