Surface contamination: A natural way towards high-resolution electric force microscopy in contact-resonant mode

Minj, AlbertAlbertMinjSerron, JillJillSerronCelano, UmbertoUmbertoCelanoParedis, KristofKristofParedis2021-10-292021-10-2920201932-7447https://imec-publications.be/handle/20.500.12860/35586Surface contamination: A natural way towards high-resolution electric force microscopy in contact-resonant modeJournal articlehttps://doi.org/10.1021/acs.jpcc.0c07639