Comparative experimental analysis of time-dependent variability using a transistor test array

Simicic, MarkoMarkoSimicicSubirats, AlexandreAlexandreSubiratsWeckx, PieterPieterWeckxKaczer, BenBenKaczerFranco, JacopoJacopoFrancoRoussel, PhilippePhilippeRousselLinten, DimitriDimitriLintenThean, AaronAaronTheanGroeseneken, GuidoGuidoGroesenekenGielen, GeorgesGeorgesGielen2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27309Comparative experimental analysis of time-dependent variability using a transistor test arrayProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7574652