Simicic, MarkoMarkoSimicicAshif, Nowab RezaNowab RezaAshifHellings, GeertGeertHellingsChen, Shih-HungShih-HungChenNag, ManojManojNagKronemeijer, Auke JiskAuke JiskKronemeijerMyny, KrisKrisMynyLinten, DimitriDimitriLinten2022-08-302022-08-182022-08-302020-04-030026-2714WOS:000531064100002https://imec-publications.be/handle/20.500.12860/40269Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistorsProceedings paper10.1016/j.microrel.2020.113632WOS:000531064100002Electrical & electronic engineeringElectrostatic dischargeESDThin-film transistorTFTIndium-gallium-zinc-oxideIndium-tin-zinc-oxideIGZOITZO