Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress

Tallarico, Andrea N.Andrea N.TallaricoStoffels, SteveSteveStoffelsMagnone, P.P.MagnoneHu, JieJieHuLenci, SilviaSilviaLenciMarcon, DenisDenisMarconSangiorgi, E.E.SangiorgiFiegna, C.C.FiegnaDecoutere, StefaanStefaanDecoutere2021-10-232021-10-2320160018-9383https://imec-publications.be/handle/20.500.12860/27376Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stressJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7373626