The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case study

Hajjiah, AliAliHajjiahAlkhabbaz, AsmaaAsmaaAlkhabbazBadran, HusseinHusseinBadranGordon, IvanIvanGordon2022-01-242021-11-022022-01-2420202211-3797WOS:000604212700007https://imec-publications.be/handle/20.500.12860/38305The effect of temperature on the forward bias electrical characteristics of both pure Ni and oxidized Ni/Au Schottky contacts on n-type GaN: A case studyJournal article10.1016/j.rinp.2020.103656WOS:000604212700007CURRENT-VOLTAGE CHARACTERISTICSMOLECULAR-BEAM EPITAXYBARRIER DIODESCURRENT-TRANSPORTCONDUCTION MECHANISMSOHMIC CONTACTSAU/N-GAASDEPENDENCEHEIGHTSRANGE