Southwick III, Richard G.Richard G.Southwick IIIPurnell, Shem T.Shem T.PurnellRapp, Blake A.Blake A.RappThompson, Ryan J.Ryan J.ThompsonPugmire, Shane K.Shane K.PugmireKaczer, BenBenKaczerGrasser, TiborTiborGrasserKnowlton, William B.William B.Knowlton2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19816Cryogenic to room temperature effects of NBTI in high-k PMOS devicesProceedings paper