Beckers, ArthurArthurBeckersBalasch, J.J.BalaschGierlichs, B.B.GierlichsVerbauwhede, I.I.VerbauwhedeOsuka, S.S.OsukaKinugawa, M.M.KinugawaFujimoto, D.D.FujimotoHayashi, Y.Y.Hayashi2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32509Characterization of EM faults on ATmega328pProceedings paper