High-temperature reliability behavior of SSI-flash EEPROM devices

De Blauwe, JanJanDe BlauweWellekens, DirkDirkWellekensGroeseneken, GuidoGuidoGroesenekenHaspeslagh, LucLucHaspeslaghVan Houdt, JanJanVan HoudtDeferm, LudoLudoDefermMaes, HermanHermanMaes2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1799High-temperature reliability behavior of SSI-flash EEPROM devicesProceedings paper