Recent progress and insights in two-dimensional carrier profiling using scanning spreading resistance microscopy

Eyben, PierrePierreEybenAlvarez, DavidDavidAlvarezClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorst2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7558Recent progress and insights in two-dimensional carrier profiling using scanning spreading resistance microscopyProceedings paper