Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

Simoen, EddyEddySimoenClaeys, C.C.ClaeysOhyama, HidenoriHidenoriOhyamaTakami, Y.Y.TakamiSunaga, H.H.Sunaga2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2138Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodesOral presentation