Stability and reliability of SiGe HBTs for BiCMOS applications

Jain, SureshSureshJainMehra, AnupamaAnupamaMehraDecoutere, StefaanStefaanDecoutereMaes, HermanHermanMaes2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4984Stability and reliability of SiGe HBTs for BiCMOS applicationsProceedings paper