Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuits

Bogaerts, WimWimBogaertsXing, YufeiYufeiXingKhan, Muhammad UmarMuhammad UmarKhan2021-10-272021-10-2720191077-260Xhttps://imec-publications.be/handle/20.500.12860/32581Layout-aware variability analysis, yield prediction, and optimization in photonic integrated circuitsJournal articlehttps://ieeexplore.ieee.org/document/8675367