Quantitative prediction of junction leakage in bulk-technology CMOS devices

Duffy, R.R.DuffyHeringa, A.A.HeringaVenezia, V.C.V.C.VeneziaLoo, JosineJosineLooVerheijen, M.A.M.A.VerheijenHopstaken, M.J.P.M.J.P.Hopstakenvan der Tak, K.K.van der Takde Potter de ten Broeck, MurielMurielde Potter de ten BroeckHooker, J.C.J.C.HookerMeunier-Beillard, P.P.Meunier-BeillardDelhougne, R.R.Delhougne2021-10-182021-10-1820100038-1101https://imec-publications.be/handle/20.500.12860/17043Quantitative prediction of junction leakage in bulk-technology CMOS devicesJournal article