Sikula, J.J.SikulaHruska, P.P.HruskaVasina, PetrPetrVasinaSchauer, P.P.SchauerKolarova, R.R.KolarovaHajek, K.K.HajekStadalnikas, A.A.StadalnikasPalenskis, V.V.PalenskisClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1479Noise and THI reliability indicators for thin film resistorsProceedings paper