Ohyama, H.H.OhyamaTakakura, T.T.TakakuraNishiyana, E.E.NishiyanaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6662Degradation behavior for high-temperature irradiated npn Si transistorsProceedings paper