Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits

Simoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaCreten, YbeYbeCretenMerken, PatrickPatrickMerkenPutzeys, JanJanPutzeysDe Moor, PietPietDe MoorClaeys, CorCorClaeysMohammazadeh, H.H.MohammazadehNickson, R.R.Nickson2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9604Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuitsProceedings paper