Gonnissen, J.J.GonnissenDe Backer, A.A.De Backerden Dekker, A.J.A.J.den DekkerSijbers, JanJanSijbersVan Aert, S.S.Van Aert2021-10-242021-10-242017-030304-3991https://imec-publications.be/handle/20.500.12860/28408Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the questionJournal articlehttps://www.sciencedirect.com/science/article/pii/S0304399116302807?via%3Dihub